2007 International RERTR Meeting
Abstracts and Available Papers Presented at the Meeting
Improvement in the Structure Identification of the Phases in the Interaction Layers U-Mo/Al-Si Employing X-Ray Diffraction with Synchrotron Radiation
M. Mirandoua,
S. Aricóa, S. Balarta, L. Gribaudoa,b and
A.M. Fortisa
a Departamento Materiales, GIDAT, GAEN, CNEA
Avda. Gral. Paz 1499, B1650KNA, San Martín, Argentina
b CONICET, Avda. Rivadavia 1917, C1033AAJ,
Buenos Aires, Argentina
ABSTRACT
During the last three years, out of pile interdiffusion experiments between U-Mo/Al-Si were carried out at 550ºC and 340ºC, in our laboratory. The characterization of the interdiffusion zones using optical microscopy, WDS, EDS and conventional X-ray diffraction showed benefical changes in these interaction layers compared to the one with pure Al. However a complete identification of the phases could not be attained. In this sense high intensity XRD with synchrotron radiation was considered the appropriated technique to improve the previous results. In this work, results obtained from the experiences performed at the LNLS Synchrotron Light Source, Brasil are presented. They indicated that Si5U3 is the main component for UMo/Al-Si at 340 ºC. This same phase was also found, together with U(Al,Si)3 and Al20Mo2U, in a sample treated at 550 ºC. This result, together with composition measurements, indicates that Si5U3 is the Si rich phase located near U-Mo which could not be identified up to now.
Full paper in PDF format
- Improvement in
the Structure Identification of the Phases in the
Interaction Layers U-Mo/Al-Si Employing X-Ray
Diffraction with Synchrotron Radiation, M.
Mirandou et al.
[PDF, 877KB, 8 pages]
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